发明名称 |
PHOTOMASK BLANK, PHOTOMASK AND METHOD FOR MANUFACTURING PHOTOMASK BLANK |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a photomask blank producing a photomask having sufficiently low line edge roughness of an etching pattern, and to provide a photomask using the blank and a method for manufacturing a photomask blank. <P>SOLUTION: In the photomask blank having a multilayer film composed of four or more layers having different compositions from one another other on a substrate, the composition on the interface between the above layers is gently inclined. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p> |
申请公布号 |
JP2004318088(A) |
申请公布日期 |
2004.11.11 |
申请号 |
JP20040067788 |
申请日期 |
2004.03.10 |
申请人 |
SHIN ETSU CHEM CO LTD |
发明人 |
YOSHIKAWA HIROKI;INAZUKI SADAOMI;FUKUSHIMA CHIKAYASU;KANEKO HIDEO;OKAZAKI SATOSHI |
分类号 |
C23C14/34;G03F1/32;G03F1/58;H01L21/027;(IPC1-7):G03F1/08 |
主分类号 |
C23C14/34 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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