发明名称 PHOTOMASK BLANK, PHOTOMASK AND METHOD FOR MANUFACTURING PHOTOMASK BLANK
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a photomask blank producing a photomask having sufficiently low line edge roughness of an etching pattern, and to provide a photomask using the blank and a method for manufacturing a photomask blank. <P>SOLUTION: In the photomask blank having a multilayer film composed of four or more layers having different compositions from one another other on a substrate, the composition on the interface between the above layers is gently inclined. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p>
申请公布号 JP2004318088(A) 申请公布日期 2004.11.11
申请号 JP20040067788 申请日期 2004.03.10
申请人 SHIN ETSU CHEM CO LTD 发明人 YOSHIKAWA HIROKI;INAZUKI SADAOMI;FUKUSHIMA CHIKAYASU;KANEKO HIDEO;OKAZAKI SATOSHI
分类号 C23C14/34;G03F1/32;G03F1/58;H01L21/027;(IPC1-7):G03F1/08 主分类号 C23C14/34
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