发明名称 Method and arrangement for measuring the coupling capacitance between two conducting lines
摘要 <p>A method and a corresponding arrangement for measuring the coupling capacitance between two interconnect lines exploits the so-called cross-talk effect and keeps an interconnect line at a constant reference voltage. The method and arrangement solve the problem of short-circuit currents that affects the known test structures, and allow a direct measurement of the coupling capacitance between the two interconnect lines. &lt;??&gt;Capacitance measurements may also be used for determining points of interruption of interconnect lines. When a line is interrupted, the measured coupling capacitance is the capacitance of a single conducting branch. The position of points of interruption of an interconnect line is determined by measuring the coupling capacitance of all segments of the line with a second conducting line. &lt;IMAGE&gt;</p>
申请公布号 EP1475642(A1) 申请公布日期 2004.11.10
申请号 EP20030425282 申请日期 2003.05.02
申请人 STMICROELECTRONICS S.R.L. 发明人 BORTESI, LUCA;VENDRAME, LORIS;BOGLIOLO, ALESSANDRO
分类号 G01R27/26;G01R31/02;G01R31/28;(IPC1-7):G01R27/26 主分类号 G01R27/26
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