发明名称 |
Method and arrangement for measuring the coupling capacitance between two conducting lines |
摘要 |
<p>A method and a corresponding arrangement for measuring the coupling capacitance between two interconnect lines exploits the so-called cross-talk effect and keeps an interconnect line at a constant reference voltage. The method and arrangement solve the problem of short-circuit currents that affects the known test structures, and allow a direct measurement of the coupling capacitance between the two interconnect lines. <??>Capacitance measurements may also be used for determining points of interruption of interconnect lines. When a line is interrupted, the measured coupling capacitance is the capacitance of a single conducting branch. The position of points of interruption of an interconnect line is determined by measuring the coupling capacitance of all segments of the line with a second conducting line. <IMAGE></p> |
申请公布号 |
EP1475642(A1) |
申请公布日期 |
2004.11.10 |
申请号 |
EP20030425282 |
申请日期 |
2003.05.02 |
申请人 |
STMICROELECTRONICS S.R.L. |
发明人 |
BORTESI, LUCA;VENDRAME, LORIS;BOGLIOLO, ALESSANDRO |
分类号 |
G01R27/26;G01R31/02;G01R31/28;(IPC1-7):G01R27/26 |
主分类号 |
G01R27/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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