发明名称 REDUNDANCY CONTROL CIRCUIT AND SEMICONDUCTOR DEVICE USING IT
摘要 PROBLEM TO BE SOLVED: To provide a redundancy circuit which can discriminate whether the information of a defective address is programmed in some specific fuse, and provide a semiconductor device using it. SOLUTION: The redundancy circuit is provided with: redundancy decoders (4, 4C) having a plurality of program circuits (4, 4C-1, 2, 3, 4) and first address setting circuits (4, 4C-0); redundancy decoder selecting circuits (2, 2A, 2B, 2C) having selection circuits (2-1, 2A-1, etc) and second address setting circuits (2-0, 2A-0, etc); and a decoder killer circuit (6). The plurality of program circuits and the plurality of selecting circuits are connected respectively by redundancy discrimination signal lines, respond to an inputted address, and take either state of a selection state and a non-selection state simultaneously and individually. Each of the plurality of program circuits has a plurality of program parts, and the program state of a specific part out of the plurality of program parts is discriminated. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004296051(A) 申请公布日期 2004.10.21
申请号 JP20030110718 申请日期 2003.04.15
申请人 ELPIDA MEMORY INC 发明人 NANBA YASUHIRO;WATABE HIROSHI
分类号 G11C29/04;G11C7/00;G11C11/401;G11C29/00;G11C29/02;(IPC1-7):G11C29/00 主分类号 G11C29/04
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