发明名称 Manufacturing method of semiconductor device
摘要 Single crystal silicon is grown in a [100] direction to make a bulk. Next, a silicon substrate with a normal of a surface extending in an inclined direction from a [100] direction is cut from the bulk. At this time, when an angle (off-angle) of inclination of the normal is decomposed into a component in a [001] direction and a component in a [010] direction, the component in the [001] direction is made within ±0.2 degrees (excluding 0 degree). An MOS transistor with a moving direction of carriers being the [001] direction is formed on the surface of the silicon substrate. At this time, after steps existing on the surface of the silicon substrate are reconstituted by thermal treatment in a hydrogen atmosphere, a gate insulation film, a gate electrode and the like are formed.
申请公布号 US2004191973(A1) 申请公布日期 2004.09.30
申请号 US20040782770 申请日期 2004.02.23
申请人 FUJITSU LIMITED 发明人 KAWAMURA HIROE
分类号 H01L21/8234;H01L21/28;H01L21/324;H01L21/8238;H01L27/088;H01L29/04;H01L29/51;H01L29/78;(IPC1-7):H01L21/00;H01L21/336;H01L21/823 主分类号 H01L21/8234
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