| 摘要 |
A first parameter is detected on a fast moving strip or yarn with a wave field, and a first signal indicating potentially present contaminants or impurities is generated. This first parameter preferably detects reflection properties that can be detected on the surface of the product. A further parameter is detected on the strip or yarn in a field, and a second signal is generated which also indicates contaminants or impurities. This second parameter preferably detects properties such as mass or diameter of the yarn or strip. Evaluations of the first signal and the second signal that occur at the same location on the product are considered together, and labeled to indicate the specific type of impurity or contaminant that they represent. Using empirical analysis, evaluation specifications can be selected to identify a group of impurities which are most likely to include a specific impurity of interest, e.g. non-vegetable contaminants.
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