发明名称 SEMICONDUCTOR WAFER MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To manufacture an environmental-friendly and inexpensive semiconductor wafer with improved productivity by omitting a polishing step. SOLUTION: This semiconductor wafer is manufactured as follows. A single face W1 of a lapped wafer LW is plane-ground, so as to remove waviness a generated in a slicing step. Thereafter, an etching volume is controlled, so as to remove a processing modification layer b generated in a plane polishing step. As a result, surface roughness is improved into a quasi-mirror condition, while a processing modification layer c generated on an opposite face W2 in a lapping step is also removed. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004255541(A) 申请公布日期 2004.09.16
申请号 JP20030051193 申请日期 2003.02.27
申请人 NAOETSU ELECTRONICS CO LTD 发明人 AKATSUKA TAKESHI;YOSHIMURA YASUSHI;OSHIMA HISASHI
分类号 B24B7/17;B24B1/00;H01L21/304;(IPC1-7):B24B1/00 主分类号 B24B7/17
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