发明名称 Method and apparatus for scanning a specimen using an optical imaging system
摘要 The invention is based on an apparatus and a method for scanning specimens (1) using an optical imaging system (3) and a scanning stage (2), images of the specimen (1) being acquired by means of a camera (4), and/or measurements on the specimen (1) being made by means of an optical measurement device (5), at specimen points Xp, Yp. For that purpose, the scanning stage (2) is calibrated by obtaining and storing height values Z at different calibration positions X, Y of the scanning stage (2), and thereby generating a running height profile of the scanning stage (2). For the scanning of specimens (1), the specimen height positions Zp at specimen points Xp, Yp are determined by means of a reference height Zref of the specimen (1) together with the running height profile of the scanning stage (2). While each specimen point Xp, Yp is being traveled to with the scanning stage (2) the relevant specimen height position Zp is already being set, so that running errors of the scanning stage (2) are compensated for and image acquisitions or measurements are possible immediately upon reaching the specimen point Xp, Yp.
申请公布号 US2004129859(A1) 申请公布日期 2004.07.08
申请号 US20030604275 申请日期 2003.07.08
申请人 LEICA MICROSYSTEMS SEMICONDUCTOR GMBH 发明人 SONKSEN DIRK;MAINBERGER ROBERT;SCHMIDT GUENTER
分类号 G02B21/00;G02B21/26;G02B21/36;(IPC1-7):G02B7/04;G02B27/40 主分类号 G02B21/00
代理机构 代理人
主权项
地址