发明名称 Methods of measuring TPTP of magnetic head and controlling recording current
摘要 A method of measuring the degree of thermal pole tip protrusion (TPTP) of a magnetic head and controlling a recording current in consideration of the degree of TPTP, in relation to a hard disk drive includes measuring the rate of errors contained in data by performing writing and reading operations while changing the level of an overshoot current (OSC), detecting a minimum error rate and a maximum error rate while changing a range of the OSC, and determining the degree of TPTP by measuring the difference between the minimum error rate and the error rate at the maximum OSC.
申请公布号 US2004125478(A1) 申请公布日期 2004.07.01
申请号 US20030733253 申请日期 2003.12.12
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM JONG-YOON;YEO CHANG-DONG
分类号 G11B5/09;G11B5/00;G11B5/012;G11B5/40;G11B5/455;G11B21/21;G11B27/36;(IPC1-7):G11B27/36;G11B5/02;G11B21/02 主分类号 G11B5/09
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