发明名称 Use in semiconductor devices of dielectric antifuses grown on silicide
摘要 A thin dielectric layer grown on a silicide layer can be used in many semiconductor devices. Such a grown dielectric, which may be, for example, a silicon oxide, silicon nitride, or silicon oxynitride dielectric layer, can advantageously be used as a dielectric antifuse. Such an antifuse paired with a diode or diode portions can operate as a memory cell, which is unprogrammed before rupture and programmed after rupture. Memory cell types using a dielectric grown on a silicide include Schottky diode portions separated by an antifuse, a Schottky diode separated from an adjacent conductor by an antifuse, and a junction diode separated from an adjacent conductor by an antifuse.
申请公布号 US2004108573(A1) 申请公布日期 2004.06.10
申请号 US20030727765 申请日期 2003.12.03
申请人 MATRIX SEMICONDUCTOR, INC. 发明人 HERNER S. BRAD
分类号 H01L23/525;(IPC1-7):H01L29/00 主分类号 H01L23/525
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