| 摘要 |
A tool and method for increasing fault coverage of an integrated circuit. The tool includes a key nodes detection device for matching key nodes to a fault grading report list of undetected nodes, a multi-sites selection device for reading a layout file of available multi unit sites for the integrated circuit, a site matching device for matching available multi-unit sites to key undetected nodes, and a netlist generation device for building logic functions in the available multi-unit sites for connection to the key undetected nodes. Use of the invention enables increased fault coverage of integrated circuit circuits for little or no added expense.
|
