发明名称 Methods for conditioning surfaces of polishing pads after chemical-mechanical polishing, and apparatuses for conditioning surfaces of polishing pads
摘要 The invention includes a method for conditioning a surface of a polishing pad after chemical-mechanical polishing of a semiconductor substrate with the pad surface. The method includes exposing the pad surface to steam, and the steam can comprise ammonium citrate. The invention also includes an apparatus for conditioning a surface of a polishing pad after chemical-mechanical polishing of a semiconductor substrate with the pad surface. The apparatus includes a conditioning stone, and a steam outlet port proximate the conditioning stone. The steam outlet port is configured to jet steam onto the pad surface during the conditioning of the pad surface.
申请公布号 US2004097176(A1) 申请公布日期 2004.05.20
申请号 US20030705371 申请日期 2003.11.10
申请人 CRON BRIAN E. 发明人 CRON BRIAN E.
分类号 B24B37/04;B24B53/007;(IPC1-7):B24B53/00 主分类号 B24B37/04
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