| 摘要 |
PURPOSE: A handler for testing semiconductor device is provided, which is capable of exactly testing a semiconductor device under various temperature conditions and reducing a test standby time by providing two index heads. CONSTITUTION: Fixing frames(13) are installed at the front part of a handler body(1) and at a front part of a test site(10), respectively. A pair of shift frames(14a,14b) are installed at the fixing frames(13) so as to be shifted along the fixing frames. A loading picker(15) and an unloading picker(16) are installed at the shift frames so as to be shifted along the shift frames(14a,14b), respectively. The first and second index heads(12a,12b) are installed at an upper side of a test socket(11) of the test site(10), and transfer a semiconductor device of the first and second loading shuttles so as to be mounted at the test socket.
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