| 发明名称 |
METHOD AND APPARATUS FOR MONITORING A TECHNICAL INSTALLATION, ESPECIALLY FOR CARRYING OUT DIAGNOSIS |
| 摘要 |
According to the invention, a temperature pattern (7) representing a current operating situation is derived from and classified by means of measured temperature values and/or other temperature information related to the technical installation (24). |
| 申请公布号 |
WO2004030172(A1) |
申请公布日期 |
2004.04.08 |
| 申请号 |
WO2002EP12447 |
申请日期 |
2002.11.07 |
| 申请人 |
SIEMENS AKTIENGESELLSCHAFT;FICK, WOLFGANG;APPEL, MIRKO;GERK, UWE |
发明人 |
FICK, WOLFGANG;APPEL, MIRKO;GERK, UWE |
| 分类号 |
G01K3/00;G01K7/42;G01N25/72;G05B19/00;H02H5/04 |
主分类号 |
G01K3/00 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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