发明名称 FORMING METHOD OF FERROELECTRIC FILM AND FERROELECTRIC MEMORY
摘要 PROBLEM TO BE SOLVED: To provide a manufacturing method of a ferroelectric film for stably forming the ferroelectric film having a large amount of polarized charge. SOLUTION: A wafer 20 is fixed to a supporting table main body 40 with a curved upper surface by a clamp 41. Next, the wafer is inserted into an MOCVD (metal organic chemical vapor deposition) device to form the ferrodielectric film on the wafer 20. Subsequently, the wafer is left until reaching a temperature not higher than the curie temperature of the ferroelectric film and, thereafter, the clamp 41 is removed and the configuration of the wafer 20 is returned to the initial state of the same. According to this method, a compressive force is applied on the ferroelectric film whereby the amount of polarized charge of the ferroelectric film is increased by the piezo-electric effect. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004087754(A) 申请公布日期 2004.03.18
申请号 JP20020246242 申请日期 2002.08.27
申请人 FUJITSU LTD 发明人 MARUYAMA KENJI;KONDO MASAO;HIDA KATSUHARU;UMEMIYA SHIGEYOSHI;HYODO HIROYUKI;KURASAWA MASAKI;MATSUURA OSATAKE;ESHITA TAKASHI;HORII YOSHIMASA;SAJITA NAOYA
分类号 H01L27/105;H01L21/8246;(IPC1-7):H01L27/105 主分类号 H01L27/105
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