发明名称 |
SEMICONDUCTOR FABRICATING APPARATUS |
摘要 |
PURPOSE: A semiconductor fabricating apparatus is provided to remarkably shorten an interval of time for forming a process condition by preventing air from being induced from the outside to the inside of a furnace while purge gas is vertically sprayed on the condition that the inlet of a path through which a wafer is loaded/unloaded is open. CONSTITUTION: Impurity gas is injected into a side of the inside of a tube having a process atmosphere of uniform temperature and pressure so as to form a layer necessary for the wafer. A purge gas spraying member is installed in the upper surface of a compression plate at the end of the semiconductor fabricating apparatus such that the compression plate loads/unloads the wafer into/from a wafer tray inside the tube. A plurality of nozzles are downward installed in the purge gas spraying member so as to be connected to a path that horizontally passes through the compression plate. When the path is opened by a door, purge gas from the nozzle is sprayed and air is prevented from being induced from the outside.
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申请公布号 |
KR20040023232(A) |
申请公布日期 |
2004.03.18 |
申请号 |
KR20020054914 |
申请日期 |
2002.09.11 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, YEONG HWAN |
分类号 |
H01L21/324;(IPC1-7):H01L21/324 |
主分类号 |
H01L21/324 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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