发明名称 SEMICONDUCTOR FABRICATING APPARATUS
摘要 PURPOSE: A semiconductor fabricating apparatus is provided to remarkably shorten an interval of time for forming a process condition by preventing air from being induced from the outside to the inside of a furnace while purge gas is vertically sprayed on the condition that the inlet of a path through which a wafer is loaded/unloaded is open. CONSTITUTION: Impurity gas is injected into a side of the inside of a tube having a process atmosphere of uniform temperature and pressure so as to form a layer necessary for the wafer. A purge gas spraying member is installed in the upper surface of a compression plate at the end of the semiconductor fabricating apparatus such that the compression plate loads/unloads the wafer into/from a wafer tray inside the tube. A plurality of nozzles are downward installed in the purge gas spraying member so as to be connected to a path that horizontally passes through the compression plate. When the path is opened by a door, purge gas from the nozzle is sprayed and air is prevented from being induced from the outside.
申请公布号 KR20040023232(A) 申请公布日期 2004.03.18
申请号 KR20020054914 申请日期 2002.09.11
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, YEONG HWAN
分类号 H01L21/324;(IPC1-7):H01L21/324 主分类号 H01L21/324
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