发明名称 Integrated circuit fabrication dual plasma process with separate introduction of different gases into gas flow
摘要 A dual plasma process generates a microwave neutral plasma remote from a semiconductor wafer and a radio frequency (RF) ionized plasma adjacent to the wafer for simultaneous application to the wafer. A first gas flows through a microwave plasma generation area, without a second gas in the gas flow, to generate the neutral microwave plasma. The second gas is added to the gas flow downstream of the microwave plasma generation area prior to an RF plasma generation area.
申请公布号 US6641698(B2) 申请公布日期 2003.11.04
申请号 US20020210365 申请日期 2002.08.01
申请人 LSI LOGIC CORPORATION 发明人 KABANSKY ALEX
分类号 C23C16/00;C23F1/00;H01L21/302;H01L21/311;H05H1/00;(IPC1-7):H05H1/00 主分类号 C23C16/00
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