SEMICONDUCTOR DEVICE TEST SYSTEM

摘要

PURPOSE: A semiconductor device test system is provided to prevent frost from be formed at a bottom of a board by blocking air flow. CONSTITUTION: A temperature regulator(120) provides air having a very low or high temperature to a semiconductor integrated circuit chip(10) to have a predetermined temperature. The temperature regulator(120) has an air injection nozzle and a transparent cylinder. The semiconductor integrated circuit chip(10) is mounted on a test circuit board(130). A tester(110) is electrically connected to the test circuit board(130) and tests features of the semiconductor integrated circuit chip(10). A sealing section(140) is movably installed at a lower surface of the test circuit board(130) and seals the lower surface of the test circuit board(130). The sealing section(140) isolates the second surface of the test circuit board(130) from an atmosphere.