| 发明名称 |
Detection of a variation in the environment of an integrated circuit |
| 摘要 |
A method and a circuit for detecting variations of at least one environmental parameter of an integrated circuit, including evaluating a propagation delay of an edge in delay elements sensitive to variations of the environmental parameter, and comparing the present or measured delay with at least one reference value.
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| 申请公布号 |
US2003117148(A1) |
申请公布日期 |
2003.06.26 |
| 申请号 |
US20020234830 |
申请日期 |
2002.09.04 |
| 申请人 |
WUIDART SYLVIE;WUIDART LUC;BARDOUILLET MICHEL;BALTHAZAR PIERRE |
发明人 |
WUIDART SYLVIE;WUIDART LUC;BARDOUILLET MICHEL;BALTHAZAR PIERRE |
| 分类号 |
G01K7/00;G06F12/14;G06F13/42;G06F21/06;G06K19/073;H01L21/822;H01L27/04;(IPC1-7):G01R27/28 |
主分类号 |
G01K7/00 |
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