发明名称 Surface plasmon resonance sensor system
摘要 The present invention relates to a sensor system for measuring the changes of refractive index and for the thickness variation of a sample medium, and the variations in concentration of a liquid sample using a surface plasmon resonance (SPR) or a sensor chip constituting the surface plasmon microscope (SPM). The surface plasmon resonance sensor system comprises a sensor chip having a sensor element on which a measuring sample is located, the sensor element is composed of a first adhesion layer, a conductive thin film, a second adhesion layer and a transparent thin film sequentially stacked on a transparent substrate; a prism attached under the sensor chip; a light source for providing light to the sensor chip through the prism; and a light-detecting element for measuring variations in the refractive index caused by resonance of surface plasmon on the conductive thin film.
申请公布号 US2003107741(A1) 申请公布日期 2003.06.12
申请号 US20020154606 申请日期 2002.05.22
申请人 PYO HYEON BONG;SHIN YONG BEOM;JEONG JI WOOK;KIM MIN GON;LEE SANG KYUNG;SHIN DONG HO;PARK SEON HEE 发明人 PYO HYEON BONG;SHIN YONG BEOM;JEONG JI WOOK;KIM MIN GON;LEE SANG KYUNG;SHIN DONG HO;PARK SEON HEE
分类号 G01N21/55;(IPC1-7):G01N21/55 主分类号 G01N21/55
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