发明名称 SEMICONDUCTOR WAFER-DRYING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor wafer-drying apparatus that can efficiently dry a semiconductor wafer reduce residual particles and its costs. SOLUTION: In the wafer-drying apparatus, a wafer 100 is heated by a heating lamp 4 or the like for preventing adhering water from freezing when pressure inside a chamber 1 is reduced for evaporating the adhering water in the wafer 100, thus efficiently drying the wafer, and reducing residual particles and its costs.
申请公布号 JP2003142451(A) 申请公布日期 2003.05.16
申请号 JP20010335105 申请日期 2001.10.31
申请人 APPLIED MATERIALS INC 发明人 KOSUGE KAZUO
分类号 F26B5/04;F26B9/06;H01L21/304;(IPC1-7):H01L21/304 主分类号 F26B5/04
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