Microforce measurement method and apparatus

摘要

A method and an apparatus for measuring the microforce acting between a micro particle fixed on the probe and the observation plane are described. The probe is feedback-controlled to be held motionless by canceling probe displacements caused by movements of the micro particle fixed on the probe, using irradiation pressure provided by a laser that applies photon pressure. The microforce acting between the micro particle fixed on the probe and the observation plane is measured by recording the time-varying laser output power. This allows probe fluctuations to be reduced to a few angstroms, and permits control of the distance to the target object to within a few nm, enabling measurement of microforces on the order of 0.1 pN.