发明名称 HIGH RESOLVING POWER MICROSCOPE AND PHASE RELAXING TIME MEASURING METHOD
摘要 <p>PROBLEM TO BE SOLVED: To provide a high resolving power microscope capable of observing the non-linear optical response of a sample with high space resolving power and high time resolving power. SOLUTION: The high resolving power microscope is equipped with an incoherent beam source 1 for generating incoherent beam, a beam splitter 7 for splitting incoherent beam into two incoherent beams, a beam delay circuit 20 for temporally delaying one split incoherent beam A, a light path length control means 10 for cyclically changing the light path length of the other split incoherent beam B to control the delay time of the incoherent beam B, and an optical probe 30 irradiating the sample to be measured with incoherent superposed beam obtained by superposing the incoherent beams A and B one upon another through a near field.</p>
申请公布号 JP2003121334(A) 申请公布日期 2003.04.23
申请号 JP20010318121 申请日期 2001.10.16
申请人 UNIV TOKYO 发明人 KOBAYASHI TAKAYOSHI;FUKUTAKE NAOKI;KOSAKA SHIGEHIRO
分类号 G01Q60/18;G01Q60/22;G02B26/06;G02F1/35;(IPC1-7):G01N13/14 主分类号 G01Q60/18
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