发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To reduce noise in a semiconductor device which includes a depression N channel transistor. SOLUTION: The depression N channel transistor has a drain region 7, formed into a circular shape and a gate region 5 whose outer periphery is in the circular shape is arranged so that it surrounds the drain region. A source region 71 is disposed outside the gate region so that it surrounds the drain region, and the source region is detached from an oxidized film for element separation 3 by a previously stipulated distance. A P<+> diffusion layer 8 is formed outside the source region and the P<+> diffusion region detaches the source region from the oxidized film for element isolation by the previously predetermined distance. A contact hole 10 is formed in the P<+> diffusion layer which is in common with the source region, and the gate region and the drain region are arranged concentrically.
申请公布号 JP2003101017(A) 申请公布日期 2003.04.04
申请号 JP20010297642 申请日期 2001.09.27
申请人 MITSUBISHI ELECTRIC CORP 发明人 YAMAMOTO FUMIHISA
分类号 H01L29/78;H01L21/336;H01L21/8234;H01L27/088;H01L29/06;H01L29/417;H01L29/423;(IPC1-7):H01L29/78;H01L21/823 主分类号 H01L29/78
代理机构 代理人
主权项
地址