| 摘要 |
PROBLEM TO BE SOLVED: To provide a test method for a microcomputer with a non-volatile semiconductor memory loaded thereon which can perform a test with appropriate test margin without increasing the number of test processes and in which improvement of the yield and reduction of the test cost can be realized. SOLUTION: The correlation of data between operation conditions and test conditions at the time of use is obtained, the data correlation value is used as a test standard, and a characteristic test of read-out operation in actual use conditions is performed by using a low speed tester. Thereby, a test by optimum test standard is realized. |
