发明名称 Semiconductor memory device utilizing tunnel magneto resistive effects and method for manufacturing the same
摘要 There is provided, according to one embodiment of this invention, a semiconductor memory device comprising first memory elements to store a first state or a second state according to a change in resistance value, each of the first memory elements comprising one terminal and the other terminal, the first memory elements arranged parallel with each other, a first wiring connected with the one terminal of each of the first memory elements, and a second wiring formed in parallel with the first wiring and connected with the other terminal of each of the first memory elements, wherein the first state or the second state stored in one of selected from the first memory elements is read out by delivering an electric current from one of the first and second wirings via the one of selected from the first memory elements to the other of the first and second wirings.
申请公布号 US2002190291(A1) 申请公布日期 2002.12.19
申请号 US20020225247 申请日期 2002.08.22
申请人 HOSOTANI KEIJI 发明人 HOSOTANI KEIJI
分类号 G11C11/14;G11C11/15;H01F10/32;H01F41/22;H01F41/32;H01L21/8246;H01L27/10;H01L27/105;H01L27/22;H01L43/08;(IPC1-7):H01L29/76 主分类号 G11C11/14
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