发明名称 |
TEST DEVICE FOR TESTING LINEARITY OF ANALOG/DIGITAL CONVERTER AND METHOD THEREOF |
摘要 |
PURPOSE: A test device for testing linearity of an analog/digital converter and a method thereof are provided, which can test the linearity of the analog/digital converter accurately without being influenced by noise, and can minimize the influence of noise using a digital filter. CONSTITUTION: A control part(42) outputs a resolution control signal to convert an analog signal into a digital signal, and controls to test linearity of the digital signal and to display a test signal. A signal generator(30) generates a triangular wave signal, and an analog/digital converter(32) converts an analog triangular wave from the signal generator into a digital signal. A memory(34) stores a code value digital-converted from the analog/digital converter by the control part. A digital filter(36) performs a digital filtering of the digital code value read from the memory by the control of the control part. A histogram generation part(38) generates a histogram by receiving the digital code value filtered from the digital filter. And a display part(40) displays the histogram by the control of the control part. A comb filter is used as the digital filter.
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申请公布号 |
KR20020084363(A) |
申请公布日期 |
2002.11.07 |
申请号 |
KR20010023515 |
申请日期 |
2001.04.30 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHO, BYEONG HWAN;OH, JEONG HUN |
分类号 |
H03M1/10;H03M1/12;(IPC1-7):H03M1/10 |
主分类号 |
H03M1/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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