发明名称 TEST DEVICE FOR TESTING LINEARITY OF ANALOG/DIGITAL CONVERTER AND METHOD THEREOF
摘要 PURPOSE: A test device for testing linearity of an analog/digital converter and a method thereof are provided, which can test the linearity of the analog/digital converter accurately without being influenced by noise, and can minimize the influence of noise using a digital filter. CONSTITUTION: A control part(42) outputs a resolution control signal to convert an analog signal into a digital signal, and controls to test linearity of the digital signal and to display a test signal. A signal generator(30) generates a triangular wave signal, and an analog/digital converter(32) converts an analog triangular wave from the signal generator into a digital signal. A memory(34) stores a code value digital-converted from the analog/digital converter by the control part. A digital filter(36) performs a digital filtering of the digital code value read from the memory by the control of the control part. A histogram generation part(38) generates a histogram by receiving the digital code value filtered from the digital filter. And a display part(40) displays the histogram by the control of the control part. A comb filter is used as the digital filter.
申请公布号 KR20020084363(A) 申请公布日期 2002.11.07
申请号 KR20010023515 申请日期 2001.04.30
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHO, BYEONG HWAN;OH, JEONG HUN
分类号 H03M1/10;H03M1/12;(IPC1-7):H03M1/10 主分类号 H03M1/10
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