发明名称 |
ESD protection circuit for advanced technologies |
摘要 |
A structure is designed with a lightly doped substrate (316) having a first conductivity type and a face. A first lightly doped region (314) has a second conductivity type and is formed within the lightly doped substrate. A first heavily doped region (308) has the first conductivity type and is formed at the face and extends to a first depth within the first lightly doped region. A second heavily doped region (312) has the second conductivity type and is formed at the face abutting the first heavily doped region. The second heavily doped region extends to a second depth and is at least partly within the first lightly doped region. A first isolation region (304) is formed at the face, abutting at least one of the first and second heavily doped regions. The first isolation region extends to a third depth that is greater than either of the first and the second depths. |
申请公布号 |
US6462380(B1) |
申请公布日期 |
2002.10.08 |
申请号 |
US20000695832 |
申请日期 |
2000.10.25 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
DUVVURY CHARVAKA;CHAINE MICHAEL D. |
分类号 |
H01L27/02;(IPC1-7):H01L23/62 |
主分类号 |
H01L27/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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