发明名称 Charged particle apparatus
摘要 A magnetism preventive cylinder is provided at a focused ion beam irradiating lens barrel tip, and an electricity preventive cylinder is mounted at an electron beam irradiating lens barrel tip. Also, the magnetism preventive cylinder is provided at the electron beam irradiating lens barrel tip in place of electricity preventive cylinder. The magnetism preventive cylinder at the focused ion beam irradiating lens barrel tip prevents a focused ion beam from being affected by a magnetic field from a focused ion beam. The electricity preventive cylinder at the electron beam irradiating lens barrel tip prevents against a magnetic field from the electron beam irradiating lens barrel tip.
申请公布号 US6452173(B1) 申请公布日期 2002.09.17
申请号 US19990315717 申请日期 1999.05.20
申请人 SEIKO INSTRUMENTS INC. 发明人 OI MASAMICHI
分类号 H01L21/66;G01Q60/44;G01Q70/06;H01J37/09;H01J37/141;H01J37/28;H01J37/305;(IPC1-7):H01J37/00 主分类号 H01L21/66
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