发明名称 |
Lightly doped silicon carbide substrate and use thereof in high power devices |
摘要 |
A method for manufacturing a silicon carbide single crystal. A silicon carbide single crystal is grown. The crystal has a boron concentration less than 5×1014 cm−3, and a concentration of transition metals impurities less than 5×1014 cm−3. Intrinsic defects in the crystal are minimised. The intrinsic defects include silicon vacancies or carbon vacancies. The crystal is annealed for a desired time at a temperature above 700° C. in an atmosphere containing any of the gases hydrogen or a mixture of hydrogen and an inert gas, such that the density of intrinsic defects and any associated defects is decreased to a concentration low enough to confer to the crystal a desired carrier life time of at least 50 ns at room temperature. |
申请公布号 |
SE0202585(D0) |
申请公布日期 |
2002.08.30 |
申请号 |
SE20020002585 |
申请日期 |
2002.08.30 |
申请人 |
OKMETIC OYJ;SICED ELECTRONICS DEVELOPMENT GMBH & CO KG |
发明人 |
ALEXANDRE *ELLISON;BJOERN *MAGNUSSON;ASKO *VEHANEN;DIETRICH *STEPHANI;HEINZ *MITLEHNER;PETER *FRIEDRICHS |
分类号 |
C30B29/36;C30B25/00;H01L21/04;H01L21/205;H01L21/324;H01L21/336;H01L29/12;H01L29/161;H01L29/24;H01L29/739;H01L29/78 |
主分类号 |
C30B29/36 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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