| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device and its test method in which a test time can be shortened further. SOLUTION: In an LCD(liquid christal display) driver 100, a register circuit 21 taking in the prescribed quantity of data from a display data RAM 17 is provided at a previous stage of a decoder circuit 19. The register circuit 21 is controlled by a column address control circuit 13 and a page address control circuit 14, the prescribed quantity of data (several bytes) decoded by the decoder circuit 19 is temporarily accumulated. In test mode, a liquid crystal driving signal of which the liquid crystal level output is controlled is obtained from a liquid crystal driving circuit 20 by utilizing the prescribed quantity of data taken in the register 21 even in the midst of performing a function test of a display data RAM 17 single body in which write and read are always performed at high speed.
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