Device and method for the inspection of the condition of a sample

摘要

The invention relates to the reflectometric analysis of samples. As opposed to conventional methods where a very small area of the sample is analyzed by irradiation by means of focused radiation and the reflected radiation is measured by position-sensitive detection, the invention utilizes a parallel or a diverging beam so as to irradiate a larger area of the sample simultaneously and also utilizes position-sensitive and energy-sensitive detection so as to derive information concerning a plurality of spots of the irradiated area of the sample at the same time.