MEMORY DEFECT REMEDY ANALYZING METHOD AND MEMORY TEST INSTRUMENT

摘要

All the data bits of fail data outputted from a logic comparator in a defect analysis memory (AFM) during test on a memory. Bit designation data designating bits in the fail data is read out of a bit designation memory (21D) during remedy. The designated bits included in the fail data read out of the defect analysis memory (AFM) and designated by the bit designation data are taken out of gates (21B-0 to 21B-N-1). The logical sum of the bit data taken out is calculated. According to the logical sum, the remedy analysis is conducted.