发明名称 Functionality testing of programmed devices
摘要 <p>The test system 100 comprises a scheduler 110 storing a database 130 of tests to be run on units under test (UUTs), e.g. as part of a procedure for approving firmware. The tests are allocated to appropriate test machines 112, 114 and 116 which execute the tests on UUTs such as 122, 124 and 126. The test system 100 allows tests to be run on UUTs in parallel and allows flexibility in the assignment of tests to appropriate test machines. &lt;IMAGE&gt;</p>
申请公布号 EP1195613(A1) 申请公布日期 2002.04.10
申请号 EP20000308807 申请日期 2000.10.06
申请人 HEWLETT-PACKARD COMPANY 发明人 WATKINS, MARK
分类号 G01R31/319;(IPC1-7):G01R31/319 主分类号 G01R31/319
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