发明名称 Semiconductor memory device with burst mode access
摘要 A data sensing control circuit according to the present invention is provided in a semiconductor memory device with a burst access mode. The data sensing control circuit generates sensing control signals for data sensing operation by use of a transition information of an address bit signal synchronized with a read enable clock signal and used for a bank selection. According to such a data sensing control scheme, no sensing of each sensing period is performed when the read enable clock signal transitions. Therefore, a power noise (or input/output noise) issued at data-out does not affect the data sensing operation of the semiconductor memory device having the burst access mode.
申请公布号 US6324115(B1) 申请公布日期 2001.11.27
申请号 US20000520730 申请日期 2000.03.08
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI BYENG-SUN
分类号 G11C11/407;G11C7/06;G11C7/10;G11C8/18;G11C11/401;(IPC1-7):G11C8/00 主分类号 G11C11/407
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