| 摘要 |
PROBLEM TO BE SOLVED: To overcome the demerit of space by eliminating test terminals for monitors. SOLUTION: For a semiconductor device having a plurality of analog input terminals AIN0 and AIN1, which have internal analog switches 11 and 12, characteristic testing of each analog input terminal switched by the analog switches 11 and 12 is conducted by simultaneously switching on the analog switches 11 and 12.
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