发明名称 Method and circuit for testing the presence of multiple supply voltages in an integrated circuit
摘要 <p>The monitoring of multiple supply voltages of an IC, part of which are externally provided and part of which, of different voltage and sign, are internally generated (12V, 5V, 3.3V, 2.5V, -5V), consisting in generating a logic signal (NPOR) monitoring the correctness of all said supply voltages after an initial soft start phase of the turn-on process, is done by using a single external capacitor (C) connected to a pin of the integrated circuit. &lt;IMAGE&gt;</p>
申请公布号 EP1083436(A1) 申请公布日期 2001.03.14
申请号 EP19990830559 申请日期 1999.09.08
申请人 STMICROELECTRONICS S.R.L. 发明人 GARBELLI, LUIGI EUGENIO;LUCIANO, GUISEPPE;PORTALURI, SALVATORE
分类号 G01R31/40;G05F1/46;(IPC1-7):G01R31/40 主分类号 G01R31/40
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