| 摘要 |
PROBLEM TO BE SOLVED: To provide an optical card defect inspecting device, which can efficiently inspect defect of optical cards having recording surfaces varying in reflection factor without any trouble to adjust a reference voltage like before. SOLUTION: The defect inspecting device which irradiates an optical card 11 with a light beam and inspects a defect on the recording surface of the optical card 11 according to reflected light from the optical card 11 has a scan driving means, which scans the optical card 11 relatively with the light beam and outputs a scanning position signal, an optical detector 25 which detects the reflected light from the recording surface of the optical card 11, and a CPU 37, which decides the defect area on the recording surface of the optical card 11 according to the variation of the detection signal of the optical detector and decides the position in the defect area on the recording surface of the optical card according to the scanning position signal outputted by the scan driving means. |
