发明名称 Method for depositing thin films in particular of a low-k dielectric
摘要 <p>An apparatus and method for depositing thin films. The apparatus generally comprises a process chamber having one or more walls and a lid and two heat exchangers. A first heat exchanger is coupled to the walls and a second heat exchanger is coupled to the lid. The two heat exchangers are configured to provide separate temperature control of the walls and lid. Separate control of the lid and wall temperatures inhibits reaction of the organosilane within the lid while optimizing a reaction within the chamber. The apparatus implements a method, in which a process gas comprising ozone and an organosilane are admitted through the into a processing while a substrate is heated to form a carbon-doped silicon oxide layer over the substrate. During deposition, the lid is kept cooler than the walls.</p>
申请公布号 EP1077274(A1) 申请公布日期 2001.02.21
申请号 EP19990402073 申请日期 1999.08.17
申请人 APPLIED MATERIALS, INC. 发明人 POKHAMA, HIMANSU;XIA, LI-QUN;LIM, TIAN-HOE
分类号 C23C16/40;C23C16/44;C23C16/455;H01L21/316;(IPC1-7):C23C16/44 主分类号 C23C16/40
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