发明名称 |
Cleaning liquid for semiconductor device manufacturing includes phosphoric acid or orthophosphoric acid which has preset hydrogen ion concentration for removing resist scum adhered to wiring layer |
摘要 |
The resist scum (22a) adhering to wiring layer (20) exposed on silicon substrate (2), has ammonium phosphate as principal component. The resist scum is removed by using phosphoric acid or orthophosphoric acid which has hydrogen ion concentration of 10-4 mol/l or more. An Independent claim is also included for semiconductor device manufacture.
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申请公布号 |
DE10019704(A1) |
申请公布日期 |
2001.01.18 |
申请号 |
DE20001019704 |
申请日期 |
2000.04.20 |
申请人 |
MITSUBISHI DENKI K.K., TOKIO/TOKYO;KISHIMOTO SANGYO CO. LTD., OSAKA |
发明人 |
KANNO, ITARU;MURANAKA, SEIJI;YAMAMOTO, HIROTADA |
分类号 |
H01L21/306;C11D7/08;C11D7/16;C11D7/32;C11D11/00;G03F7/42;H01L21/02;H01L21/311;H01L21/3213;(IPC1-7):C11D7/32;H01L21/768 |
主分类号 |
H01L21/306 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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