发明名称 Cleaning liquid for semiconductor device manufacturing includes phosphoric acid or orthophosphoric acid which has preset hydrogen ion concentration for removing resist scum adhered to wiring layer
摘要 The resist scum (22a) adhering to wiring layer (20) exposed on silicon substrate (2), has ammonium phosphate as principal component. The resist scum is removed by using phosphoric acid or orthophosphoric acid which has hydrogen ion concentration of 10-4 mol/l or more. An Independent claim is also included for semiconductor device manufacture.
申请公布号 DE10019704(A1) 申请公布日期 2001.01.18
申请号 DE20001019704 申请日期 2000.04.20
申请人 MITSUBISHI DENKI K.K., TOKIO/TOKYO;KISHIMOTO SANGYO CO. LTD., OSAKA 发明人 KANNO, ITARU;MURANAKA, SEIJI;YAMAMOTO, HIROTADA
分类号 H01L21/306;C11D7/08;C11D7/16;C11D7/32;C11D11/00;G03F7/42;H01L21/02;H01L21/311;H01L21/3213;(IPC1-7):C11D7/32;H01L21/768 主分类号 H01L21/306
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