发明名称 TEST METHOD OF RELIABILITY OF FERROELECTRIC CAPACITOR
摘要 PROBLEM TO BE SOLVED: To provide the test method of the reliability of a ferroelectric capacitor which is hardly influenced by difference in the polarization hysteresis characteristics between respective ferroelectric capacitors and has high precision. SOLUTION: A polarization hysteresis curve after the polarization toward a positive side and a polarization hysteresis curve after the polarization toward a negative side are repeatedly measured while an offset electric field is varied in a process P102 to obtain the offset electric field dependence of the nonvolatile polarization. Offset electric fields corresponding to the nonvolatile polarizations after being preserved for at least two different periods are obtained in a process P106. The approximate straight line of the preservation period dependence of the offset electric field is obtained by a method of least squares to calculate the offset electric field in a product guarantee period in a process P107. The nonvolatile polarization with the offset electric field in the product guarantee period is calculated in a process P108.
申请公布号 JP2000340474(A) 申请公布日期 2000.12.08
申请号 JP19990147957 申请日期 1999.05.27
申请人 MATSUSHITA ELECTRONICS INDUSTRY CORP 发明人 TAKEO MASATO
分类号 H01G13/00;G01R31/00;(IPC1-7):H01G13/00 主分类号 H01G13/00
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