| 摘要 |
PROBLEM TO BE SOLVED: To attain global transformation between the partial images of a scanned original by using affine transformation to discriminate global transformation, dividing each partial image into blocks which does not overlap with each other and applying clustering processing to enable estimation of block parameters. SOLUTION: A sub image memory section 231 stores various sub images that are acquired from an original, by using a scanner 100 and sent to a scanning image positioning system 200 via a link 110 and an input output interface 220. An affine parameter generating circuit 250 receives two block sub images and generates an image affine parameter that is required to deform one image, in a way that it is positioned to the other image and/or a base sub image. A sub image deformation circuit 270 uses the affine transformation parameter to deform the input sub image. Then a block conversion parameter is generated, which is then subjected to cluster processing. |
