发明名称 SEMICONDUCTOR DEVICE MANUFACTURING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device manufacturing apparatus, which can shorten manufacturing time for a semiconductor device and can ensure the high yield of the manufacture of the semiconductor device. SOLUTION: This manufacturing device is provided with a treating chamber 150, provided with a susceptor 140 for supporting a substrate 10 to be treated in its inside, an exhaust means 160 which is coupled with the chamber 150 and vacuum-exhausts the chamber 150, a gas feeding means 170 which is coupled with the chamber 150 and feeds gas to the chamber 150, a first power supply 210 for applying a prescribed voltage to the substrate 10, an activation means 190 which activates the gas introduced in the chamber 150 and has a second power supply 200, and a control part 220 which controls the power supplies 200 and 210 and the gas to perform ion doping treatment or etching treatment on the substrate 10.
申请公布号 JP2000243721(A) 申请公布日期 2000.09.08
申请号 JP19990040889 申请日期 1999.02.19
申请人 TOSHIBA CORP 发明人 OANA YASUHISA;FUKUDA KAICHI;DOI TAKAYOSHI
分类号 H01L29/786;G02F1/136;G02F1/1368;H01L21/22;H01L21/26;H01L21/265;H01L21/268;H01L21/302;H01L21/3065;H01L21/336 主分类号 H01L29/786
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