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发明名称
APPARATUS AND METHOD FOR SECONDARY ELECTRON EMISSION MICROSCOPE
摘要
申请公布号
EP1029340(A1)
申请公布日期
2000.08.23
申请号
EP19980957381
申请日期
1998.10.26
申请人
KLA-TENCOR CORPORATION
发明人
ADLER, DAVID, A.;WALKER, DAVID, J.;BABIAN, FRED;WOLFE, TRAVIS
分类号
G01N23/225;G01Q30/02;H01J37/244;H01J37/28;H01J37/285;H01L21/66;(IPC1-7):H01J37/26
主分类号
G01N23/225
代理机构
代理人
主权项
地址
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