发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a technique by which an STI can be formed without performing CMP(chemical mechanical polishing) which raises a dishing problem nor requiring any active dummy pattern. SOLUTION: A semiconductor device manufacturing method in which an element isolating area is formed by forming active area isolating grooves 15 into a semiconductor substrate 11 and filling up the grooves 15 with insulating films 18 includes a step of forming a resist film 19 on the insulating films 18 after forming the insulating films 18 on the semiconductor substrate 11 so that the films may fill up the grooves 15, a step of generating data about the positions of patterns in an active area isolated by the element isolating area by directly reading the positions, and a step of forming an opening 20 through the resist film 19 on the active area by exposing and developing the film 19, based on the data. The method also includes a step of selectively removing the insulating films 18 on the active area from the opening 20.
申请公布号 JP2000232153(A) 申请公布日期 2000.08.22
申请号 JP19990032251 申请日期 1999.02.10
申请人 SONY CORP 发明人 YAMAZAKI TAKESHI
分类号 H01L21/76;(IPC1-7):H01L21/76 主分类号 H01L21/76
代理机构 代理人
主权项
地址