发明名称 |
Antireflective coating and wiring line stack |
摘要 |
Titanium aluminum nitrogen ("Ti-Al-N") is deposited onto a semiconductor substrate area to serve as an antireflective coating. For wiring line fabrication processes, the Ti-Al-N layer serves as a cap layer which prevents unwanted reflection of photolithography light (i.e., photons) during fabrication. For field emission display devices (FEDs), the Ti-Al-N layer prevents light originating at the display screen anode from penetrating transistor junctions that would hinder device operation. For the wiring line embodiment an aluminum conductive layer and a titanium-aluminum underlayer are formed beneath the antireflective cap layer. The Ti-Al underlayer reduces the shrinkage which occurs in the aluminum conductive layer during heat treatment.
|
申请公布号 |
US6040613(A) |
申请公布日期 |
2000.03.21 |
申请号 |
US19960588738 |
申请日期 |
1996.01.19 |
申请人 |
MICRON TECHNOLOGY, INC. |
发明人 |
MCTEER, EVERETT A.;ZAHORIK, RUSSELL C.;MEIKLE, SCOTT G. |
分类号 |
H01J9/02;G09F9/30;H01J1/52;H01J29/04;H01J29/89;H01J29/96;H01J31/12;H01L21/027;H01L21/3205;H01L21/3213;H01L21/768;H01L23/52;H01L23/532;H01L31/0216;(IPC1-7):H01L31/023 |
主分类号 |
H01J9/02 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|