发明名称 High electron mobility transistor
摘要 A high electron mobility transistor structure (10) is provided having an insulating substrate (12) having a substrate lattice constant. A buffer layer (14) is disposed over the substrate and has a graded lattice constant substantially equal to a first lattice constant near a bottom of the buffer layer and substantially equal to a second lattice constant near a top of the buffer layer larger than the substrate lattice constant and the first lattice constants. A channel layer (22) is disposed above the buffer layer and has a concentration of indium to provide a lattice constant of the channel layer that is larger than the substrate lattice constant.
申请公布号 AU4847799(A) 申请公布日期 2000.02.21
申请号 AU19990048477 申请日期 1999.06.29
申请人 RAYTHEON COMPANY 发明人 WILLIAM E. HOKE;PETER J. LEMONIAS
分类号 H01L21/285;H01L21/335;H01L29/778 主分类号 H01L21/285
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