发明名称
摘要 <p>PROBLEM TO BE SOLVED: To form a fine through-hole in a thick tungsten (W) film. SOLUTION: A W film 2 is formed on an Si substrate 1. Then, an SiO2 film 3 is formed on the W film 2, it is patterned, and a fine through-hole pattern which is composed of the SiO2 film 3 is formed. Then a W film 6 which covers the through-hole pattern (the SiO2 film 3) is formed on the W film 2. Then, the Si substrate 1, the W film 2, the through-hole pattern and the W film 6 are cut so as to cross the through-hole pattern. Then, a face which is exposed by their cutting operation is polished to as to be a required thickness. Lastly, the through-hole pattern is removed by a wet etching operation. Thereby, a fine through-hole can be formed in the W films 2, 6.</p>
申请公布号 JP3004240(B2) 申请公布日期 2000.01.31
申请号 JP19970329221 申请日期 1997.11.28
申请人 发明人
分类号 G03F1/76;G03F7/20;H01L21/027;H01L21/3205;H01L21/768;(IPC1-7):H01L21/027 主分类号 G03F1/76
代理机构 代理人
主权项
地址