发明名称 X-RAY INSPECTION DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide an X-ray inspection device without any shading difference of an image due to the difference in the application dose of X rays and with improved conformity/nonconformity judgment accuracy. SOLUTION: The X-ray inspection device is provided with an X-ray application part 1 for applying X rays toward subjects 4a, 4b, and 4c, a sensor 5 for detecting X rays which has passed through the subjects 4a, 4b, and 4c, and a traveling mechanism for relatively moving the subjects 4a, 4b, and 4c for the X-ray application part 1 and the sensor 5. The X-ray application part 1 is provided with filters 2a, 2b, and 2c with a plurality of sites with a different X-ray transmittance and can change the sites of the filters 2a, 2b, and 2c that are used by a step for applying light to each of a plurality of subjects 4a, 4b, and 4c, thus eliminating the difference in the application dose due to the leading time of an application dose rate, making constant the application dose by a fixed amount of application time, and constantly obtaining the same gray level image, and improving the judgment accuracy in a binary image.</p>
申请公布号 JPH11326242(A) 申请公布日期 1999.11.26
申请号 JP19980134959 申请日期 1998.05.18
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 MITO YOSHIO
分类号 G01B15/00;G01N23/04;H05K3/00;(IPC1-7):G01N23/04 主分类号 G01B15/00
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