INSPECTION METHOD OF SEMICONDUCTOR DEVICE AND CONDUCTIVE ADHESIVE FOR INSPECTION,申请号KR19960000063-传众专利搜索

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发明名称	INSPECTION METHOD OF SEMICONDUCTOR DEVICE AND CONDUCTIVE ADHESIVE FOR INSPECTION
摘要
申请公布号	KR100227078(B1)	申请公布日期	1999.10.15
申请号	KR19960000063	申请日期	1996.01.05
申请人	MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.	发明人	NAKAMURA, YOSIHUMI;TOMURA, YOSIHIRO;BESSYO, YOSIHIRO
分类号	H01L21/66;(IPC1-7):H01L21/66	主分类号	H01L21/66
代理机构		代理人
主权项
地址

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