发明名称 Semiconductor memory device having hierarchical bit line structure
摘要 A semiconductor memory device includes a semiconductor substrate, a plurality of sub bit line pairs formed on the semiconductor substrate, a main bit line pair formed at a layer above the plurality of sub bit line pairs, a plurality of selecting transistors, a plurality of word lines located to cross the sub bit line pairs, and a plurality of memory cells. Each selecting transistor is provided corresponding to one sub bit line and has one source/drain region connected to a corresponding sub bit line. At a layer above the other source/drain region of the selecting transistor, an intermediate layer is formed in the same layer as that of a storage node of memory cell. The intermediate layer is connected to the other source/drain region of the selecting transistor through a contact hole formed beneath it. The intermediate layer is further connected to the main bit line through another contact hole formed on the intermediate layer.
申请公布号 US5815428(A) 申请公布日期 1998.09.29
申请号 US19970893045 申请日期 1997.07.14
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 TSURUDA, TAKAHIRO;TSUKUDE, MASAKI
分类号 G11C11/401;G11C7/18;G11C11/34;G11C11/4097;H01L21/8242;H01L27/10;H01L27/108;(IPC1-7):G11C5/06 主分类号 G11C11/401
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